After a two-week final stretch the winners of the first Carl Zeiss Nano Image Contest have now been chosen. The winners are:
• Heinrich Badenhorst from the University of Pretoria, South Africa (category Scanning Electron Microscopy (SEM)),
• Norman Hauke and Arne Laucht of the Walter Schottky Institute of Munich Technical University, Germany (category CrossBeam (FIB-SEM)),
• Dr. Emile van Veldhoven of the TNO Research Institute in Delft, Netherlands, (category Helium Ion Microscopy (HIM)) and
• Dr. Andrey Burov of the Russian Academy of Sciences in Saratov in the category Transmission Electron Microscopy (TEM).
The Managing Director of Carl Zeiss NTS, Dr. Frank Stietz, is very pleased at the excellent response to the contest with over 120 entries: “The broad spectrum of application topics, the technical quality and the artistic composition of the nano images are fascinating. We would like to thank all participants for their entries and extend our congratulations to the winners.”
Carl Zeiss (Pty) LTD
Tel: (011) 886 9510